Located approximately 30 feet below ground and slab-on-grade, the facility was founded in 2016, motivated by the need for world-class instrumentation in support of research on planetary materials including analysis of samples to-be returned by the UA-led OSIRIS-REx Mission. Analyzing samples at scales accessible to these techniques can be vital to research across physical sciences and engineering. The facility is open to the entire UA community, as well as to regional private- and public-sector users.
Scanning Electron Microscope
The scanning electron microscope (SEM) suite currently includes two microscopes with room for a third instrument.View the SEM
Focused-Ion-Beam Scanning Electron Microscope
The focused-ion-beam scanning electron microscope (FIB-SEM) lab houses an FEI Helios NanoLab 660.View the FIB-SEM