The Kuiper Materials Imaging and Characterization Facility is housed in Kuiper Space Sciences Building.

Located approximately 30 feet below ground and slab-on-grade, the facility was founded in 2016, motivated by the need for world-class instrumentation in support of research on planetary materials including analysis of samples to-be returned by the UA-led OSIRIS-REx Mission. Analyzing samples at scales accessible to these techniques can be vital to research across physical sciences and engineering. The facility is open to the entire UA community, as well as to regional private- and public-sector users.

Scanning Electron Microscope

The scanning electron microscope (SEM) suite currently includes two microscopes with room for a third instrument.

View the SEM

Focused-Ion-Beam Scanning Electron Microscope

The focused-ion-beam scanning electron microscope (FIB-SEM) lab houses an FEI Helios NanoLab 660.

View the FIB-SEM

Transmission Electron Microscope

The transmission electron microscope (TEM) lab features a Hitachi HF5000 instrument.

View the TEM

Electron Microprobe

The electron microprobe (EPMA) lab features Cameca SX-50 and Cameca SX-100 Ultra instruments.

View the EPMA

Renishaw Reflex Raman (Optical)

The Renishaw InVia is confocal Raman microscope with an automated stage.

View the Renishaw Reflex Raman (Optical) Microsope